- Home
- Sequential Ray Tracing
- Analysis Features
Analysis Features
These articles give examples of some specific analysis features and tools that are useful for sequential system design.
How to Produce Photo-Realistic Output Images
- By Mark Nicholson
- Published 31 July 2006
- Analysis Features
-
Rating:




This article describes how to take high-resolution .BMP or .JPG images and ray-trace them through a sequential optical system. The resulting high resolution, photo-realistic images provide compelling evidence of final system performance, and can help to communicate that performance to non-optics specialists.
Performing Partially Coherent Diffraction Image Analysis
- By Andrew Locke
- Published 15 October 2007
- Analysis Features
-
Rating:




This article explains:
- What Partially Coherent Diffraction Image Analysis is
- What different types of partial coherence Gamma functions are available
- The two different computations methods that can be used for partial coherence
- What sampling issues to watch out for when performing partially coherent analysis
How to Reverse an Optical System
- By Andrew Locke
- Published 30 March 2007
- Analysis Features , Frequently Asked Questions
-
Rating:




This article explains how to use the Reverse Elements tool to reverse an entire sequential optical system.
How to Use the Center of Curvature Report to Aid System Alignment
- By Bob Parks
- Published 31 July 2006
- User Articles , Analysis Features
-
Rating:




Centered optical systems are relatively easy to design and align, but when decentered and tilted surfaces are used , alignment becomes difficult unless you have a plan. This article describes how to use the Center of Curvature report to give the necessary datums for system alignment.
How to Use the Quick Adjust Tool and Slider
- By Mark Nicholson
- Published 31 July 2006
- Analysis Features , First Time Users
-
Rating:




The Quick Adjust tool is invaluable during early system setup, letting you easily adjust important surface data to achieve a variety of conditions. This article describes how to use it, and its related feature, the Slider.
How to Include Detector Resolution in MTF Calculations
- By Mark Nicholson
- Published 2 May 2008
- Analysis Features
- Unrated
MTF is a commonly used to describe the performance of an imaging system, but the finite resolution of the detection system is often ignored. This article describes how to account for detector pixel sizes and position shifts to give a full-system MTF measurement.
How To Draw Specific Rays in ZEMAX Layouts
- By Dan Hill
- Published 20 September 2005
- Analysis Features
-
Rating:




This article explains:
- How to draw desired rays in the ZEMAX Layouts via the RAYLIST
- What the RAYLIST is
- The difference between IMPLICIT and EXPLICIT methods for defining rays in the RAYLIST
- How to use each format with visual aids