This article describes how to create a glass catalog to contain your own glass data.

MTF is a commonly used to describe the performance of an imaging system, but the finite resolution of the detection system is often ignored. This article describes how to account for detector pixel sizes and position shifts to give a full-system MTF measurement.

This article describes a fast method to identify which surfaces in a design will best benefit from aspherization.

This article explains the range of ZEMAX surfaces and objects than can be exactly defined using NURBS, and gives an example of exporting high-order aspheres.

Many corporate customers want to convert from multiple single-user keys to network keys,but want to make sure that their networks are properly configured before changing something that's worked for years. ZEMAX  has a built-in diagnostic that lets you set up a network key server without actually having a network key attached, and that then tests the connection to the server so you're sure the network key won't be blocked by firewalls, security software etc.

Question: With the network key I can see what is using a ZEMAX license at any one time. Can I write this data to a log file for subsequent analysis?

Updated December 2007. This article explains how to choose a workstation for running ZEMAX on. It concentrates on:

• Choice of Processors
• Amount of Memory
• Graphics Card
• Some other Frequently Asked Questions about computers

 

This article explains how to submit test plate, lens and glass catalog data for distribution with ZEMAX.

This article explains:

• What to do if ZEMAX asks you for a license code when you run the program
• What to do if ZEMAX cannot find your hardware key when you run the program

This is a companion article to How To Model a 'Black-Box' Optical System Using Zernike Coefficients, and discusses the special case of an all-reflective design. This uses a Zernike Sag surface, instead of a Zernike Phase surface. The benefit is that the resulting system models the original all-reflective system at all wavelengths for a given field point.